Nanosurf

應用 :半導體製程量測、奈米材料或元件檢測、生物分子。

STM measurement
STM Scan Head	500 nm	1 μm	500nm LC(low current)	1μm LC(low current)
Maximum Scan range	500 nm	1.0 μm	500 nm	1.0 μm
Maximum Z-range	200 nm	200 nm	200 nm	200 nm
Drive resolution Z	3 pm	3 pm	3 pm	3 pm

AFM measurement
AFM Scan Head	10μm	70 μm	110 μm
Maximum Scan range	10μm	70 μm	110 μm
Maximum Z-range	2 μm	14 μm	22 μm
Driver resolution Z	0.027 nm	0.21 nm	0.34 nm

整合多功能手提式原子力顯微鏡AFM

Model: Mobile S (All-In-One AFM)
整合多功能現場量測的尖兵。
Maximum scan range: 110μm, 10μm
Maximum Z-range: 22μm, 1.8μm
Drive resolution Z: 0.34nm, 0.027nm
Drive resolution XY: 1.7μm, 0.15μm
Image Measurement Modes:
1. Static Force Mode
2. Dynamic Force Mode
3. Phase Contract Mode
4. Force Modulation Mode
5. Spreading Resistance Mode
6. User ADC Input Signal in all Modes